- 9.2 Measurement and Software 360
- 9.2.1 Software Defects 361
- 9.2.2 The Spectrum of Defect Analysis 364
- 9.3 Principles of ODC 367
- 9.3.1 The Intuition 367
- 9.3.2 The Design of Orthogonal Defect Classification 370
- 9.3.3 Necessary Condition 371
- 9.3.4 Sufficient Conditions 373
- 9.4 The Defect-Type Attribute 374
- 9.5 Relative Risk Assessment Using Defect Types 376
- 9.5.1 Subjective Aspects of Growth Curves 377
- 9.5.2 Combining ODC and Growth Modeling 379
- 9.6 The Defect Trigger Attribute 384
- 9.6.1 The Trigger Concept 384
- 9.6.2 System Test Triggers 387
- 9.6.3 Review and Inspection Triggers 387
- 9.6.4 Function Test Triggers 388
- 9.6.5 The Use of Triggers 389
- 9.7 Multidimensional Analysis 393
- 9.8 Deploying ODC 396
- 9.9 Summary 398
- Problems 399
Chapter Author: Ram Chillarege
Book Editor: Michael Lyu.
Published by: IEEE Computer Society Press and McGraw-Hill Book Company